Open AccessThe role of the electron inelastic scattering processes in EELFS spectra
Author(s) -
Guy D. E.,
Grebennikov V. I.,
Surnin D. V.,
Ruts Yu. V.
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500019245
Subject(s) - pseudopotential , spectral line , electron , atomic physics , inelastic scattering , scattering , atom (system on chip) , plasmon , dispersion (optics) , ionization , electron spectroscopy , core electron , molecular physics , physics , nuclear physics , optics , ion , quantum mechanics , astronomy , computer science , embedded system
The pseudopotential model is used for the evaluation of the core level ionisation intensities (by the electron impact). The central atom effective phase shift is calculated for K EELFS spectra in this framework. The Si K EELFS spectra were calculated and compared with the experimental data. The comparison of experimental and calculated results is performed on the base of the electron dispersion law which takes into account electron‐plasmon interaction.