Open AccessDevelopment of a new in‐laboratory XAFS apparatus based on new concept
Author(s) -
Taguchi Takeyoshi,
Harada Jimpei,
Kiku Atsunori,
Tohji Kazuyuki,
Shinoda Kozo
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500018458
Subject(s) - goniometer , x ray absorption fine structure , sample (material) , position (finance) , tube (container) , optics , monochromatic color , x ray tube , in situ , materials science , computer science , anode , physics , composite material , spectroscopy , finance , quantum mechanics , electrode , meteorology , economics , thermodynamics
In a conventional in‐laboratory XAFS apparatus using conventional X‐ray source, sealed tube or rotating anode, has been used. In which the X‐ray source is fixed and the sample is moved (translated and rotated). Hence it has been difficult or required a complex method in order to put a heavy element, such as a cryogenic cooler, high temperature furnace and an in‐situ reacting cell, at a sample position. Nowadays, there is a strong demand for obtaining dynamic information of a sample and in‐situ observation becomes almost unavoidable. We have developed a compact X‐ray tube and a new goniometer on which X‐ray source is moved and monochromatic X‐ray comes out of goniometer is fixed. Therefore it becomes easier to put a various cell at a sample position.