Open AccessGeneration of an X‐ray microbeam for spectromicroscopy at SPring‐8 BL39XU
Author(s) -
Hayakawa Shinjjiro,
Ikuta Natsuki,
Suzuki Motohiro,
Wakatsuki Masao,
Hirokawa Takeshi
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500018446
Subject(s) - microbeam , undulator , optics , spring 8 , beam (structure) , physics , materials science , radiation , beamline
A pair of elliptical mirrors (KB mirror) was designed and fabricated to realize an energy tunable x‐ray microbeam for spectro‐microscopy at SPring‐8 BL39XU. As is commonly recognized, the obtainable beam size with the aspherical total reflection mirrors is strongly affected with the slope error of the mirror. Considering that the extremely high brilliance of the undulator radiation from the SPring‐8, the small mirror size and the small mirror‐to‐focus distance were employed to minimize effects of the slope error. Preliminary evaluation of the KB mirror was carried out using 10 keV monochromatized undulator radiation. Alignment of the mirror was assisted by the beam monitor system composed of a scintillator and a CCD, and the beam size less than 5 mm can be easily achieved even when the source was fully used. The beam size obtained with this experiment was 2 × 4 µm 2 with the photon flux of 1 × 10 10 photons/s. Smaller beam size may be expected with the use of intermediate slits. Characterization of trace elements with the spatial resolution will be carried out by using x‐ray fluorescence (XRF) analysis and x‐ray absorption fine structure (XAFS) measurements with XRF yield method.