Open AccessQuantitative analysis of L ‐edge white line intensities: the influence of saturation and transverse coherence
Author(s) -
Hahlin Anders,
Karis Olof,
Brena Barbara,
Hunter Dunn Jonathan,
Arvanitis Dimitri
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500018367
Subject(s) - coherence (philosophical gambling strategy) , saturation (graph theory) , spectroscopy , optics , spectral line , physics , attenuation coefficient , absorption spectroscopy , radiation , atomic physics , coherence time , materials science , mathematics , combinatorics , quantum mechanics , astronomy
We have performed x‐ray absorption spectroscopy at the Fe, Ni, and Co L 2,3 edges of in situ grown thin magnetic films. We compare electron yield measurements performed at SSRL and BESSY‐I. Differences in the L 2,3 white line intensities are found for all three elements, comparing data from the two facilities. We propose a correlation between spectral intensities and the degree of spatial coherence of the exciting radiation. The electron yield saturation effects are stronger for light with a higher degree of spatial coherence. Therefore the observed, coherence related, intensity variations are due to an increase in the absorption coefficient, and not to secondary channel related effects.