Open AccessA new X‐ray spectrometer for high‐resolution Compton profile measurements at SPring‐8
Author(s) -
Hiraoka N.,
Itou M.,
Ohata T.,
Mizumaki M.,
Sakurai Y.,
Sakai N.
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500018197
Subject(s) - spectrometer , spring 8 , resolution (logic) , physics , detector , bent molecular geometry , spectrum analyzer , compton scattering , momentum (technical analysis) , electron , optics , nuclear physics , materials science , beamline , beam (structure) , finance , artificial intelligence , computer science , economics , composite material
An X‐ray spectrometer for high‐resolution Compton profile measurements using 90–120 keV X‐rays has been designed and constructed at SPring‐8. A Cauchois‐type triply layered bent‐crystal analyzer was employed for the energy analysis. A novel use of a solid‐state detector with a large active area was devised as a position‐sensitive detector. A resolution of 0.10 atomic units in electron momentum has been achieved at an incident X‐ray energy of 115 keV. A Compton profile of a single crystal of Nb was measured with a counting rate of 30 counts s −1 at the Compton peak, which demonstrates that the spectrometer is capable of measuring Compton profiles of heavy‐element materials.