Open AccessEXAFS study of NiAl in thin films
Author(s) -
Arčon Iztok,
Mozetič Miran,
Kodre Alojz,
Jagielski Jacek,
Traverse Agnes
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500016642
Subject(s) - extended x ray absorption fine structure , nickel aluminide , nial , materials science , aluminide , alloy , thin film , analytical chemistry (journal) , stoichiometry , nickel , mixing (physics) , redistribution (election) , transition metal , xanes , spectral line , absorption spectroscopy , metallurgy , intermetallic , nanotechnology , chemistry , optics , catalysis , law , biochemistry , chromatography , quantum mechanics , political science , physics , astronomy , politics
Technologically important coatings of transition‐metal aluminides can be produced by thermal or ion beam mixing of multilayer structures sputter deposited on substrates. The quantitative detection of constituents by depth profiling is sufficient to establish the efficiency of mixing methods. However, to decide whether a mixture of nanoparticles or a stoichiometric alloy is formed, EXAFS analysis of the local atomic neighborhood in the film is required. Ni K edge EXAFS spectra are measured on a series of samples of Ni/Al multilayer on Si(111) surface, after ion mixing at different substrate temperatures. The spectra show that with increasing temperature the nickel aluminide phase gradually substitutes the Ni fcc metal phase.