Open AccessThree‐dimensional analysis of the local structure of Cu on TiO 2 (110) by in situ polarization‐dependent total‐reflection fluorescence XAFS
Author(s) -
Tanizawa Yasuhiro,
Chun WangJae,
Shido Takafumi,
Asakura Kiyotaka,
Iwasawa Yasuhiro
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500016034
Subject(s) - x ray absorption fine structure , extended x ray absorption fine structure , polarization (electrochemistry) , metal , materials science , in situ , chemistry , fluorescence , analytical chemistry (journal) , absorption spectroscopy , optics , spectroscopy , physics , quantum mechanics , metallurgy , organic chemistry , chromatography
Cu K-edge XAFS of Cu/TiO2(110) was measured by polarization-dependent total-reflection fluorescence XAFS technique. XAFS of [001], [110], and [110] directions were measured to elucidate the three dimensional structure of Cu species on the TiO2(110) surface prepared by the deposition of Cu(DPM)2 followed by reduction with H2. Simulation of the EXAFS functions as well as conventional curve fitting analysis revealed that plane Cu3,4 small clusters with similar structure to Cu(111) plane were formed by the reduction at 363 K. The small clusters converted into spherical metallic Cu particles by the reduction at 473 K.