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Experimental technique for radiative‐process‐resolved X‐ray absorption spectroscopy at the inner‐shell excitation thresholds
Author(s) -
Muramatsu Yasuji,
Ueno Yuko,
Sasaki Teikichi A.,
Gullikson Eric M.,
Perera Rupert C. C.
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500015867
Subject(s) - absorption (acoustics) , spectroscopy , radiative transfer , absorption spectroscopy , materials science , scattering , atomic physics , extended x ray absorption fine structure , diamond , analytical chemistry (journal) , chemistry , optics , physics , chromatography , quantum mechanics , composite material
Partial‐fluorescence‐yield (PFY) x‐ray absorption measurements, using the optimized window widths of position sensitive detectors in wave‐length dispersive x‐ray spectrometers, have been applied for radiative‐process‐resolved (RPR) x‐ray absorption spectroscopy. We have measured PFY‐absorption spectra of graphite and diamond at the C K threshold and of h ‐BN and c ‐BN at the B K threshold. Resonant elastic x‐ray scattering was observed in graphite and h ‐BN on their PFY‐absorption spectra, and excitonic x‐ray scattering was observed in diamond and c ‐BN. These results show that PFY‐absorption measurements for RPR x‐ray absorption spectroscopy can provide the information about the electronic structures and the radiative‐decay process in inner‐shell excitation.

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