Open AccessA position‐sensitive ionization chamber for XAFS studies at synchrotron sources
Author(s) -
Sato Kazumichi
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500015855
Subject(s) - ionization chamber , monochromator , beamline , ionization , synchrotron , optics , detector , beam (structure) , electrometer , micrometer , spring 8 , position (finance) , synchrotron radiation , physics , materials science , atomic physics , ion , wavelength , finance , quantum mechanics , economics
A position‐sensitive ionization chamber has been developed with backgammon‐type‐segmented electrodes. This novel detector possesses a linear range of 8 mm for determining the incident position of the X‐ray beam incoming. The position resolution was found to be less than 10 µm, probably close the sub‐micrometer region. Owing to its high spatial resolution, the position‐sensitive ionization chamber was able to commit that the gradual decrease observed in the X‐ray beam intensity at a SPring‐8 beamline was mainly due to the spatial variation of the X‐ray beam in time. The present work also confirmed the applicability of the novel detector to the accurate monochromator adjustment for experiments using diamond anvil cells.