Open AccessMultiple‐beam X‐ray interferometry for phase‐contrast microtomography
Author(s) -
Bonse Ulrich,
Beckmann Felix
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500015843
Subject(s) - optics , synchrotron radiation , interferometry , phase (matter) , synchrotron , beam (structure) , phase contrast imaging , diffraction , materials science , physics , planar , bar (unit) , phase contrast microscopy , computer science , computer graphics (images) , quantum mechanics , meteorology
The first successful operation of an X‐ray interferometer under conditions of non‐planar three‐beam diffraction for phase‐contrast X‐ray microtomography is reported. Intrinsic phase differences of the reflections used cancel from the three‐dimensional phase image of the specimen. With simultaneous hkl and reflections of a synchrotron radiation beam in a side‐by‐side geometry, the size of the usable field of view is doubled and the investigated specimen volume is increased by a factor of four. As an example, the reconstructed slice of a mouse kidney is shown in phase contrast at 71 keV. Optimized choices of three‐beam reflections and matching interferometer geometries useful for applications are presented.