Open AccessXAFS investigations of tin nitrides
Author(s) -
LützenkirchenHecht Dirk,
Scotti Nicole,
Jacobs Herbert,
Frahm Ronald
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500015119
Subject(s) - x ray absorption fine structure , tin , valency , nitride , annealing (glass) , materials science , crystallography , ion , xanes , local structure , nitrogen , halide , crystal structure , analytical chemistry (journal) , redistribution (election) , chemistry , inorganic chemistry , metallurgy , nanotechnology , physics , spectroscopy , linguistics , philosophy , organic chemistry , layer (electronics) , quantum mechanics , politics , political science , law , chromatography
Tin nitrides (Sn 3 N 4 ) prepared by the reaction of Sn‐halides with KNH2 in liquid ammonia and a subsequent vacuum annealing procedure were investigated with transmission mode XAFS experiments. While the near edge data suggest the presence of a univalent Sn‐compound with a valency close to +4, the analysis of the extended X‐ray absorption fine structure proves the presence of two different local Sn sites in this crystal structure: While Sn(1) is surrounded by 4 nitrogen in a distance of 2.06 Å, each Sn(2) ion is coordinated with 6 nitrogen at about 2.17 Å radial distance.