XAFS investigations of tin nitrides | Zendy

LützenkirchenHecht Dirk | Zendy; Scotti Nicole | Zendy; Jacobs Herbert | Zendy; Frahm Ronald | Zendy

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XAFS investigations of tin nitrides

Author(s) -

LützenkirchenHecht Dirk,

Scotti Nicole,

Jacobs Herbert,

Frahm Ronald

Publication year - 2001

Publication title -

journal of synchrotron radiation

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.172

H-Index - 99

ISSN - 1600-5775

DOI - 10.1107/s0909049500015119

Subject(s) - x ray absorption fine structure , tin , valency , nitride , annealing (glass) , materials science , crystallography , ion , xanes , local structure , nitrogen , halide , crystal structure , analytical chemistry (journal) , redistribution (election) , chemistry , inorganic chemistry , metallurgy , nanotechnology , physics , spectroscopy , linguistics , philosophy , organic chemistry , layer (electronics) , quantum mechanics , politics , political science , law , chromatography

Tin nitrides (Sn 3 N 4 ) prepared by the reaction of Sn‐halides with KNH2 in liquid ammonia and a subsequent vacuum annealing procedure were investigated with transmission mode XAFS experiments. While the near edge data suggest the presence of a univalent Sn‐compound with a valency close to +4, the analysis of the extended X‐ray absorption fine structure proves the presence of two different local Sn sites in this crystal structure: While Sn(1) is surrounded by 4 nitrogen in a distance of 2.06 Å, each Sn(2) ion is coordinated with 6 nitrogen at about 2.17 Å radial distance.

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