
Magnetic domains in nanostructured media studied with M‐TXM
Author(s) -
Fischer P.,
Eimüller T.,
Schütz G.,
Bayreuther G.,
Tsunashima S.,
Takagi N.,
Denbeaux G.,
Attwood D.
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500015089
Subject(s) - optics , nucleation , magnetic field , magnetic circular dichroism , resolution (logic) , magnetic domain , materials science , nanostructure , optical microscope , microscope , image plane , microscopy , physics , image (mathematics) , nanotechnology , computer science , spectral line , scanning electron microscope , magnetization , quantum mechanics , astronomy , artificial intelligence , thermodynamics
Combining X‐ray magnetic circular dichroism (X‐MCD) with a transmission X‐ray microscope (TXM) allows to image element‐specifically magnetic domain structures with 25 nm lateral resolution. Both in‐plane and out‐of‐plane systems can be studied in applied magnetic fields. Thus field‐dependent parameters, as individual nucleation fields in magnetic nanostructures can be deduced and related to morphology. Images of thermomagnetically written bits in magneto‐optical TbFeCo media proof the reliability of the writing process and the importance of an exact thermal design of the systems. Domains observed at corresponding Co L edges proof the chemical sensitivity of M‐TXM and its potential to image few monolayer systems.