Open AccessHigh‐resolution soft X‐ray absorption spectroscopy of solids
Author(s) -
Saitoh Y.,
Muro T.,
Kotsugi M.,
Iwasaki T.,
Sekiyama A.,
Imada S.,
Suga S.
Publication year - 2001
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500015016
Subject(s) - x ray absorption spectroscopy , absorption spectroscopy , spectral line , spectroscopy , absorption (acoustics) , ion , materials science , resolution (logic) , high resolution , analytical chemistry (journal) , electronic structure , atomic physics , chemistry , optics , physics , computational chemistry , remote sensing , organic chemistry , chromatography , quantum mechanics , astronomy , artificial intelligence , computer science , composite material , geology
The present research deals with the high‐resolution soft x‐ray absorption spectra (XAS) of Si, Ce‐ and Sm‐ compounds measured at BL25SU of SPring‐8. The spectra are compared with theoretical results. The Si 1 s spectrum shows good agreement with the calculated empty density of states so far reported. The Ce 3 d spectra are very sensitive to the local electronic structure. The Sm 3 d XAS of SmS shows clear temperature dependence, which is partly explained by a calculation for Sm 2+ ion.