Open AccessDemonstration of X‐ray linear dichroism imaging with hard X‐rays
Author(s) -
Sato K.,
Okitsu K.,
Ueji Y.,
Matsushita T.,
Amemiya Y.
Publication year - 2000
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500009985
Subject(s) - linear dichroism , polarizer , x ray , dichroism , materials science , optics , polarization (electrochemistry) , k edge , phase (matter) , nuclear magnetic resonance , physics , crystallography , circular dichroism , birefringence , chemistry , absorption spectroscopy , quantum mechanics
X‐ray polarization‐contrast images resulting from X‐ray linear dichroism (XLD) in the hard X‐ray region have been successfully recorded for the first time. The apparatus used consisted of an X‐ray polarizer, double X‐ray phase retarders and a high‐spatial‐resolution X‐ray charge‐coupled device (CCD) detector. The sample used was a hexagonal close packed (h.c.p.) cobalt single‐crystal foil of thickness about 12 µm. The experiment was performed at X‐ray energies of 23 and 29 eV above the cobalt K edge (7709 eV), at which the maximum linear dichroisms (∼3%) were observed, with their signs reversed, in the XLD spectrum measured with quadruple X‐ray phase retarders. The contrasts in the images at the two X‐ray energies were reversed as a result of the XLD in the sample. Furthermore, the values of the contrast in the images arising from the linear dichroism (∼3%) were in good agreement with those yielded by the XLD spectrum.