Open AccessWavelength‐dispersive double flat‐crystal analyzer for inelastic X‐ray scattering
Author(s) -
Bortel G.,
Alp E. E.,
Sturhahn W.,
Toellner T. S.
Publication year - 2000
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s090904950000950x
Subject(s) - spectrum analyzer , scattering , optics , inelastic scattering , resolution (logic) , wavelength , crystal (programming language) , range (aeronautics) , physics , resonant inelastic x ray scattering , materials science , atomic physics , x ray raman scattering , artificial intelligence , computer science , composite material , programming language
A double flat‐crystal analyzer for inelastic X‐ray scattering is described. The general correlation between the energy and direction of the X‐rays transmitted by the analyzer allows one to collect data for a range of energy transfers simultaneously. Such an analyzer with 120 meV resolution was built to operate at the copper K edge. Experimental results show that this X‐ray optic can be an alternative to a conventional spherical‐focusing backscattering analyzer in resonant inelastic X‐ray scattering experiments or when flexible energy resolution or high momentum resolution is required.