Open AccessIn situ EXAFS, X‐ray diffraction and photoluminescence for high‐pressure studies
Author(s) -
Sapelkin Andrei V.,
Bayliss Sue C.,
Russell Dean,
Clark Simon M.,
Dent Andy J.
Publication year - 2000
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500005252
Subject(s) - extended x ray absorption fine structure , beamline , synchrotron radiation , synchrotron , photoluminescence , surface extended x ray absorption fine structure , absorption (acoustics) , diffraction , materials science , optics , absorption spectroscopy , optoelectronics , physics , beam (structure)
A new facility for simultaneous extended X‐ray absorption of fine structure (EXAFS), X‐ray diffraction and photoluminescence measurements under high pressures has been developed for use on station 9.3 at the Daresbury Laboratory Synchrotron Radiation Source. This high‐pressure facility can be used at any suitable beamline at a synchrotron source. Full remote operation of the rig allows simultaneous collection of optical and structural data while varying the pressure. The set‐up is very flexible and can be tailored for a particular experiment, such as time‐ or temperature‐dependent measurements. A new approach to the collection of high‐pressure EXAFS data is also presented. The approach significantly shortens the experimental times and allows a dramatic increase in the quality of EXAFS data collected. It also opens up the possibility for EXAFS data collection at any pressure which can be generated using a diamond cell. The high quality of data collected is demonstrated with a GaN case study. Particular attention will be paid to the use of energy‐dispersive EXAFS and quick‐scanning EXAFS techniques under pressure.