Open AccessExtraction of accurate structure‐factor amplitudes from Laue data: wavelength normalization with wiggler and undulator X‐ray sources
Author(s) -
Šrajer Vukica,
Crosson Sean,
Schmidt Marius,
Key Jason,
Schotte Friedrich,
Anderson Spencer,
Perman Benjamin,
Ren Zhong,
Teng T.Y.,
Bourgeois Dominique,
Wulff Michael,
Moffat Keith
Publication year - 2000
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500004672
Subject(s) - wiggler , undulator , physics , synchrotron radiation , optics , beamline , wavelength , normalization (sociology) , synchrotron , amplitude , spectral line , laser , electron , nuclear physics , beam (structure) , astronomy , sociology , cathode ray , anthropology
Wavelength normalization is an essential part of processing of Laue X‐ray diffraction data and is critically important for deriving accurate structure‐factor amplitudes. The results of wavelength normalization for Laue data obtained in nanosecond time‐resolved experiments at the ID09 beamline at the European Synchrotron Radiation Facility, Grenoble, France, are presented. Several wiggler and undulator insertion devices with complex spectra were used. The results show that even in the most challenging cases, such as wiggler/undulator tandems or single‐line undulators, accurate wavelength normalization does not require unusually redundant Laue data and can be accomplished using typical Laue data sets. Single‐line undulator spectra derived from Laue data compare well with the measured incident X‐ray spectra. Successful wavelength normalization of the undulator data was also confirmed by the observed signal in nanosecond time‐resolved experiments. Single‐line undulators, which are attractive for time‐resolved experiments due to their high peak intensity and low polychromatic background, are compared with wigglers, based on data obtained on the same crystal.