
Phase imaging using highly coherent X‐rays: radiography, tomography, diffraction topography
Author(s) -
Baruchel José,
Cloetens Peter,
Härtwig Jürgen,
Ludwig Wolfgang,
Mancini Lucia,
Pernot Petra,
Schlenker Michel
Publication year - 2000
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500002995
Subject(s) - optics , beamline , synchrotron radiation , phase contrast imaging , diffraction , phase (matter) , tomography , synchrotron , radiography , materials science , coherence (philosophical gambling strategy) , coherent diffraction imaging , physics , phase retrieval , phase contrast microscopy , beam (structure) , fourier transform , quantum mechanics , nuclear physics
Several hard X‐rays imaging techniques greatly benefit from the coherence of the beams delivered by the modern synchrotron radiation sources. This is illustrated with examples recorded on the `long' (145 m) ID19 `imaging' beamline of the ESRF. Phase imaging is directly related to the small angular size of the source as seen from one point of the sample (`effective divergence' ≃ microradians). When using the `propagation' technique, phase radiography and tomography are instrumentally very simple. They are often used in the `edge detection' regime, where the jumps of density are clearly observed. The in situ damage assessment of micro‐heterogeneous materials is one example of the many applications. Recently a more quantitative approach has been developed, which provides a three‐dimensional density mapping of the sample (`holotomography'). The combination of diffraction topography and phase‐contrast imaging constitutes a powerful tool. The observation of holes of discrete sizes in quasicrystals, and the investigation of poled ferroelectric materials, result from this combination