z-logo
open-access-imgOpen Access
Phase imaging using highly coherent X‐rays: radiography, tomography, diffraction topography
Author(s) -
Baruchel José,
Cloetens Peter,
Härtwig Jürgen,
Ludwig Wolfgang,
Mancini Lucia,
Pernot Petra,
Schlenker Michel
Publication year - 2000
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500002995
Subject(s) - optics , beamline , synchrotron radiation , phase contrast imaging , diffraction , phase (matter) , tomography , synchrotron , radiography , materials science , coherence (philosophical gambling strategy) , coherent diffraction imaging , physics , phase retrieval , phase contrast microscopy , beam (structure) , fourier transform , quantum mechanics , nuclear physics
Several hard X‐rays imaging techniques greatly benefit from the coherence of the beams delivered by the modern synchrotron radiation sources. This is illustrated with examples recorded on the `long' (145 m) ID19 `imaging' beamline of the ESRF. Phase imaging is directly related to the small angular size of the source as seen from one point of the sample (`effective divergence' ≃ microradians). When using the `propagation' technique, phase radiography and tomography are instrumentally very simple. They are often used in the `edge detection' regime, where the jumps of density are clearly observed. The in situ damage assessment of micro‐heterogeneous materials is one example of the many applications. Recently a more quantitative approach has been developed, which provides a three‐dimensional density mapping of the sample (`holotomography'). The combination of diffraction topography and phase‐contrast imaging constitutes a powerful tool. The observation of holes of discrete sizes in quasicrystals, and the investigation of poled ferroelectric materials, result from this combination

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here