Open AccessA conical slit for three‐dimensional XRD mapping
Author(s) -
Nielsen S. F.,
Wolf A.,
Poulsen H. F.,
Ohler M.,
Lienert U.,
Owen R. A.
Publication year - 2000
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049500000625
Subject(s) - conical surface , optics , diffraction , slit , materials science , texture (cosmology) , beam (structure) , volume (thermodynamics) , debye , physics , image (mathematics) , composite material , computer science , quantum mechanics , artificial intelligence , condensed matter physics
Traditionally, depth resolution in diffraction experiments is obtained by inserting pinholes in both the incoming and diffracted beam. For materials science investigations of local strain and texture properties this leads to very slow data‐acquisition rates, especially when characterization is performed on the level of the individual grains. To circumvent this problem a conical slit has been manufactured by wire‐electrodischarge machining. The conical slit has six 25 µm‐thick conically shaped openings matching six of the Debye–Scherrer cones from a face‐centred‐cubic powder. By combining the slit with a microfocused incoming beam of hard X‐rays, an embedded gauge volume is defined. Using a two‐dimensional detector, fast and complete information can be obtained regarding the texture and strain properties of the material within this particular gauge volume. The average machining and assemblage errors of the conical slit are found both to be of the order of 5 µm. An algorithm for alignment of the slit is established, and the potential of the technique is illustrated with an example of grain mapping in a 4.5 mm‐thick Cu sample.