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Application of high‐energy synchrotron radiation for texture studies
Author(s) -
Mishin O. V.,
Lauridsen E. M.,
Krieger Lassen N. C.,
Brückner G.,
Tschentscher T.,
Bay B.,
Juul Jensen D.,
Poulsen H. F.
Publication year - 2000
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889899016684
Subject(s) - texture (cosmology) , synchrotron radiation , materials science , diffraction , scanning electron microscope , aluminium , synchrotron , optics , composite material , physics , image (mathematics) , computer science , artificial intelligence
A novel experimental technique that employs high‐energy synchrotron radiation is used for the investigation of through‐thickness texture gradients in two aluminium plates, cold‐rolled 40% with either intermediate or small draughts. In these two plates, crystallographic textures are inspected in a large number of layers. Texture maps of pole densities throughout the sample thickness are presented. A texture of the rolling type is developed through the plate thickness after intermediate draught rolling. Pronounced inhomogeneities associated with the shear texture are observed in the sample rolled with small draughts. For selected layers, direct pole figures are compared with those obtained by traditional low‐energy X‐ray diffraction and by the electron backscattering pattern technique using a scanning electron microscope. A good qualitative agreement between textures measured using the three different techniques is obtained. Experimental aspects and potentials of the new technique are discussed.