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Parallel‐beam X‐ray diffractometry using X‐ray guide tubes
Author(s) -
Yamanoi Toyoko,
Nakazawa Hiromoto
Publication year - 2000
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889899015344
Subject(s) - x ray , beam (structure) , diffraction , diffractometer , x ray crystallography , materials science , silicon , powder diffraction , optics , beam divergence , orientation (vector space) , powder diffractometer , crystallography , physics , laser beam quality , geometry , chemistry , scanning electron microscope , laser beams , optoelectronics , laser , mathematics
A parallel‐beam X‐ray diffraction geometry using X‐ray guide tubes is proposed to eliminate preferred‐orientation effects in powder X‐ray diffraction (XRD) patterns and for new applications of XRD. A bundle of X‐ray guide tubes (polycapillaries) is used to provide an intense quasi‐parallel (approximately 0.2° divergence) and large‐diameter (approximately 20 mm) beam of X‐rays needed for parallel‐beam diffractometry. Mica and silicon particles were agitated inside a cylindrical chamber by a steady flow of N 2 gas so that they were randomly oriented. The quasi‐parallel incident X‐ray beam passed through the cloud of floating particles. The diffracted X‐rays were detected using a standard 2θ diffractometer. The integrated intensities observed agree well with those calculated from the known model of the crystal structure. This result demonstrates that this type of diffractometry is capable of avoiding preferred‐orientation effects and of collecting XRD data for moving powder samples.