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Derivation of infinite‐slit‐smeared small‐angle scattering from porous surface and porous mass fractals
Author(s) -
McMahon P. J.,
Moss S. D.
Publication year - 1999
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889899008559
Subject(s) - fractal , small angle x ray scattering , deconvolution , small angle scattering , scattering , porosity , surface (topology) , normalization (sociology) , materials science , optics , geometry , physics , mathematical analysis , mathematics , composite material , sociology , anthropology
Small‐angle X‐ray scattering (SAXS) is often used to study porous and aggregated fractal materials. Typically when q is small or when large primary‐beam intensities are required, the small‐angle geometry employed introduces infinite‐slit‐height smearing into the experimental data. Herein, simple derivations for infinite‐slit‐height‐smeared SAXS from porous surface and mass fractals are presented, including an approximation for aggregated mass fractals. The models allow rapid analysis of background‐subtracted data without the need for deconvolution. An equation is derived that allows analysis of normalization from deconvolution routines applied to porous‐fractal data. This model is tested using simulated and experimental SAXS data.