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The coherent electron microdiffraction of a single translation domain boundary in β‐Ni 3 Nb phase
Author(s) -
Pan H. Y.,
Du K.,
Wang Y. M.,
Zhu Jing,
Li S. Y.,
Ye H. Q.
Publication year - 1999
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889899007402
Subject(s) - transmission electron microscopy , field emission gun , electron diffraction , diffraction , translation (biology) , domain (mathematical analysis) , materials science , boundary (topology) , crystallography , electron microscope , phase (matter) , high resolution transmission electron microscopy , optics , physics , chemistry , mathematics , quantum mechanics , messenger rna , gene , mathematical analysis , biochemistry
The microdiffraction from a single translation domain boundary (TDB) in β‐Ni 3 Nb has been recorded by using a Hitachi HF‐2000 field emission gun transmission electron microscope, while high‐resolution transmission electron microscopy images were used to assist the analysis. The diffraction splitting effect of a TDB is well explained by the kinematics and dynamic calculations, and complex diffraction characteristics have been studied by using dynamics simulation.