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X‐ray powder diffraction quantitative analysis performed in situ at high temperature: application to the determination of NiO in ceramic pigments
Author(s) -
Gualtieri Alessandro F.,
Mazzucato Edoardo,
Venturelli Paolo,
Viani Alberto,
Zannini Paolo,
Petras Laszlo
Publication year - 1999
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889899005853
Subject(s) - non blocking i/o , spinel , nickel oxide , powder diffraction , ceramic , diffraction , materials science , x ray crystallography , thermal analysis , phase (matter) , oxide , nickel , chemical engineering , analytical chemistry (journal) , mineralogy , thermal , metallurgy , crystallography , chemistry , optics , thermodynamics , physics , organic chemistry , engineering , catalysis
Although nickel(II) oxide (NiO) is a potential carcinogenic agent, it is still used in the synthesis of ceramic pigments because during their preparation at high temperature, NiO is thought to combine with other compounds, crystallizing as new phases with spinel‐like structures. Unfortunately, there are no widely accepted methods for the determination of free NiO in ceramics, the main reason being experimental difficulties. In fact, quantitative phase analysis (QPA) by X‐ray powder diffraction (XRPD) may fail because diffraction peaks of NiO with space group Fm 3¯ m and a ≃ 4.18 Å overlap with those of the spinel with space group Fd 3¯ m and a ≃ 8.4 Å. To overcome this problem, in this work QPA has been performed in situ at high temperature to resolve the peak overlap of NiO and spinel by taking advantage of the different thermal expansion of each phase. It is believed that this is the first report of the application of this technique.