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A self‐consistent method for X‐ray diffraction analysis of multiaxial residual‐stress fields in the near‐surface region of polycrystalline materials. I. Theoretical concept
Author(s) -
Genzel Christoph
Publication year - 1999
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889899005506
Subject(s) - diffraction , scattering , crystallite , lattice (music) , tensor (intrinsic definition) , residual , residual stress , materials science , laplace transform , x ray crystallography , cauchy stress tensor , x ray , penetration depth , physics , optics , mathematical analysis , condensed matter physics , crystallography , geometry , mathematics , chemistry , composite material , algorithm , acoustics
In recent work, the scattering‐vector method was shown to be well suited for the detection of residual stress fields, which vary significantly within the penetration depth τ of the X‐rays. It allows the separate evaluation of individual components σ ij (τ) of the stress tensor directly from a series of measured ɛ ϕψ ( hkl , τ) depth profiles, which are obtained after stepwise rotation of the sample around the scattering vector g ϕψ for fixed angle sets (ϕ, ψ). In this paper, a solution of improved stability for deriving the Laplace stress profiles σ ij (τ) is presented. It is based on the extreme sensitivity of the individual ɛ ϕψ ( hkl , τ) profiles with respect to the strain‐free lattice spacing d 0 ( hkl ), which can be used as a criterion for a simultaneous determination of d 0 ( hkl ) itself as well as of optimized σ ij (τ) profiles.