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Automatic orientation determination from Kikuchi patterns
Author(s) -
Morawiec A.
Publication year - 1999
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188989900549x
Subject(s) - orientation (vector space) , reliability (semiconductor) , computer science , sensitivity (control systems) , algorithm , search engine indexing , artificial intelligence , geometry , mathematics , physics , electronic engineering , engineering , power (physics) , quantum mechanics
Some formal aspects of crystal orientation determination from Kikuchi patterns are discussed, with respect to writing general and fast algorithms for automatic indexing of the patterns and orientation determination. The geometry of the problem is presented in a general form which is also suitable for channeling patterns or X‐ray Kossel patterns. Moreover, geometrical ambiguities and other reliability issues are considered. Some strategies designed to handle artifacts of automatic pattern analysis are presented. Finally, the reliability and the accuracy of the described procedures and the sensitivity of the results to the errors of the basic measurement parameters were tested on computer‐generated patterns.