Premium
Quantitative texture analysis of small domains with synchrotron radiation X‐rays
Author(s) -
Heidelbach F.,
Riekel C.,
Wenk H.R.
Publication year - 1999
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889899004999
Subject(s) - microbeam , synchrotron radiation , beamline , texture (cosmology) , materials science , monochromatic color , aluminium , synchrotron , crystallite , optics , x ray , crystallography , composite material , beam (structure) , metallurgy , physics , chemistry , computer science , artificial intelligence , image (mathematics)
Quantitative analysis of crystallographic preferred orientation (texture) of very small volumes in fine‐grained polycrystalline materials has been carried out with a monochromatic X‐ray microbeam (≤30 µm) at the microfocus beamline of the European Synchrotron Radiation Facility (ESRF). The experimental procedure is described and illustrated with textures of rolled aluminium, aluminium and steel wires, polymer fibers and natural bone material (apatite).