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Deconvolution of the two‐dimensional point‐spread function of area detectors using the maximum‐entropy algorithm
Author(s) -
Graafsma H.,
De Vries R. Y.
Publication year - 1999
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889899003817
Subject(s) - deconvolution , detector , point spread function , optics , diffraction , physics , principle of maximum entropy , image resolution , algorithm , ptychography , optical transfer function , resolution (logic) , mathematics , computer science , artificial intelligence , statistics
The maximum‐entropy method (MEM) has been applied for the deconvolution of the point‐spread function (PSF) of two‐dimensional X‐ray detectors. The method is robust, model and image independent, and only depends on the correct description of the two‐dimensional point‐spread function and gain factor of the detector. A significant enhancement of both the spatial resolution and the contrast ratio has been obtained for two phase‐contrast images recorded with an ultra‐high‐resolution X‐ray imaging detector. The method has also been applied to a Laue diffraction image of a protein crystal, showing an important improvement in both the peak separation of closely spaced diffraction peaks and the signal‐to‐noise ratio of medium and weak peaks. The principle of the method is explained and examples of its application are presented.