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An elastically bent silicon monochromator for a neutron diffractometer
Author(s) -
Tanaka Ichiro,
Niimura Nobuo,
Mikula Pavel
Publication year - 1999
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889899003192
Subject(s) - monochromator , bent molecular geometry , diffractometer , neutron , optics , monochromatic color , powder diffractometer , materials science , silicon , crystallography , physics , chemistry , optoelectronics , diffraction , nuclear physics , wavelength , scanning electron microscope , composite material
A new type of elastically bent perfect Si (EBP‐Si) monochromator for a neutron diffractometer dedicated to protein crystallography has been developed and successfully applied to two such diffractometers. It was experimentally demonstrated that the monochromatic neutron intensity increased and the beam was focused at the sample position when the monochromator was suitably bent. A specially designed bender for the EBP‐Si monochromator, already applied to several diffractometers, is described. The distinctive features of the EBP‐Si monochromator are summarized.