Premium
MESO – a program to convert X‐ray diffraction data from angular to reciprocal space
Author(s) -
Locherer K. R.,
Buckley A.,
Salje E. K. H.
Publication year - 1999
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889898017221
Subject(s) - reciprocal lattice , reciprocal , diffraction , siemens , scattering , space (punctuation) , optics , x ray , physics , detector , domain (mathematical analysis) , materials science , crystallography , computer science , chemistry , mathematics , mathematical analysis , philosophy , linguistics , quantum mechanics , operating system
A computer code has been developed to convert X‐ray diffraction data generated by Siemens X‐1000 and Siemens HISTAR area detectors and INEL CPS 120 linear detectors from angular to reciprocal space. Programs have been written to visualize and analyse the resulting data using AVS (Advanced Visual Systems Inc., MA, USA). Two examples of the application of MESO to problems in X‐ray diffuse scattering are presented. Firstly, the `butterfly' associated with tweed microstructure in the high‐temperature superconductor YBa 2 (Cu 1– x M x ) 3 O 7–δ . Secondly, the `dog bone' generated by scattering off domain walls in the perovskite‐like WO 3 .