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X‐ray diffraction texture analysis of cylindrical samples
Author(s) -
Guillén R.,
Cossu C.,
Jacquot T.,
François M.,
Bourniquel B.
Publication year - 1999
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889898012990
Subject(s) - goniometer , diffraction , tilt (camera) , materials science , texture (cosmology) , optics , curvature , beam (structure) , ray tracing (physics) , x ray tube , x ray , sample (material) , physics , geometry , mathematics , image (mathematics) , computer science , electrode , anode , quantum mechanics , artificial intelligence , thermodynamics
The effect of the curvature of the sample surface on X‐ray diffraction has been studied. A theoretical model, based on a ray‐tracing method, has been developed to take into account the geometric effects which modify the collected intensities. The model enables alignment corrections for the sample and the incident beam, in relation to the goniometer centre. This can be achieved by comparing experimental normalized intensities for a zero tilt angle (ψ = 0°) to the normalized intensities calculated by the model. The texture analysis of a zircaloy‐4 tube (with a 9.5 mm diameter and an incident‐beam spot size of 1.2 mm diameter) confirms the validity of the results.