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Two‐ and Three‐Beam X‐ray Diffraction Imaging of Domains in Magnetite
Author(s) -
Medrano C.,
Heyroth F.,
Schlenker M.,
Baruchel J.,
Espeso J.
Publication year - 1998
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889898004403
Subject(s) - beam (structure) , diffraction , optics , synchrotron radiation , ferrimagnetism , synchrotron , materials science , bragg's law , crystal (programming language) , beam divergence , contrast (vision) , physics , diffraction topography , beam diameter , magnetic field , laser , magnetization , laser beams , quantum mechanics , computer science , programming language
The X‐ray diffraction topographic imaging process for ferrimagnetic domains in magnetite Fe 3 O 4 at room temperature is investigated, in two‐ and three‐beam cases, for incident synchrotron radiation beams differing in angular divergence and energy spread. In the usual two‐beam configuration, domain or wall contrast is obtained from the difference in Bragg conditions, or from the slight difference in the direction of the beams diffracted by neighbouring domains, revealed by the large crystal‐to‐film distance that can be used at a third‐generation synchrotron radiation facility. A three‐beam Umweganregung case involving the weak 171 and the strong 131 reflections shows unusual domain contrast on the 171 topographs, even on images involving energy or angle integration; this contrast is particularly evident on white‐beam topographs. The high angular sensitivity this implies is associated with the difference in dispersion relation between the two reflections.