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Image Plates as One‐Dimensional Detectors in High‐Resolution X‐ray Diffraction
Author(s) -
Kinne A.,
Thoms M.,
Ress H. R.,
Gerhard T.,
Ehinger M.,
Faschinger W.,
Landwehr G.
Publication year - 1998
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188989701947x
Subject(s) - optics , reciprocal lattice , detector , diffraction , resolution (logic) , physics , scintillation , image resolution , materials science , artificial intelligence , computer science
An image plate has been used as a detector for high‐resolution X‐ray diffraction of semiconductor heterostructures. A series of 2 θ intensity distributions is recorded for different rocking angles ω for the sample and subsequently transformed to a reciprocal‐space map. Maps of symmetric and asymmetric reflections of two samples are presented. A reduction in measurement time by a factor of 36 was achieved by recording information simultaneously along 2 θ on the image plate compared to conventional measurement with a scintillation counter. Favourable results were obtained with broad reflections from samples with low structural quality and asymmetric reflections in the grazing exit geometry.