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Modelling Dislocation‐Induced Anisotropic Line Broadening in Rietveld Refinements Using a Voigt Function. II. Application to Neutron Powder Diffraction Data
Author(s) -
Wu E.,
Kisi E. H.,
Gray E. Mac A.
Publication year - 1998
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889897012181
Subject(s) - neutron diffraction , dislocation , rietveld refinement , materials science , anisotropy , crystallography , diffraction , neutron , powder diffraction , transmission electron microscopy , voigt profile , condensed matter physics , chemistry , optics , physics , crystal structure , composite material , nuclear physics , spectral line , nanotechnology , astronomy
In paper I [Wu et al. (1998). J. Appl. Cryst. 31 , 356–362] an approach was developed to the problem of modelling dislocation‐induced X‐ray or neutron‐diffraction‐line broadening. This paper applies those findings to the Rietveld refinement of the neutron powder diffraction profiles of deuterium‐cycled LaNi 5 and β ‐PdD 0.66 . These interstitially modified materials exhibit, respectively, strong and weak anisotropic strain broadening. The broadening in LaNi 5 is consistent with a dislocation slip system a /3 (110) {010}, in agreement with transmission electron microscopy studies. In PdD 0.66 the model predicts a regular distribution of screw dislocations, which remains to be confirmed by other techniques.