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Modelling Dislocation‐Induced Anisotropic Line Broadening in Rietveld Refinements Using a Voigt Function. I. General Principles
Author(s) -
Wu E.,
Gray E. Mac A.,
Kisi E. H.
Publication year - 1998
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188989701217x
Subject(s) - voigt profile , dislocation , rietveld refinement , crystallite , anisotropy , neutron diffraction , line (geometry) , diffraction , materials science , condensed matter physics , kelvin–voigt material , neutron , function (biology) , crystallography , physics , optics , geometry , chemistry , mathematics , spectral line , composite material , nuclear physics , quantum mechanics , evolutionary biology , viscoelasticity , biology
The theory of dislocation‐induced X‐ray or neutron diffraction line broadening developed by Krivoglaz et al. and Wilkens has been adapted for Rietveld refinement of the powder diffraction profile by fitting a Voigt function to each peak. Information on both the type of slip system and the density of dislocations in the crystallites may then be found by evaluating the shape parameter and the index‐dependent breadth of the Voigt function.