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A simplified, texture‐based method for intensity determination of overlapping reflections in powder diffraction
Author(s) -
Lasocha W.,
Schenk H.
Publication year - 1997
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889897011023
Subject(s) - texture (cosmology) , intensity (physics) , diffraction , powder diffraction , orientation (vector space) , maxima , materials science , phase (matter) , ab initio , crystallography , optics , image (mathematics) , computer science , chemistry , physics , mathematics , artificial intelligence , geometry , art , organic chemistry , performance art , art history
Powder diffraction intensities are almost always affected by texture (preferred orientation) and overlapping of the maxima, which make phase analysis or ab initio structure solution and refinement difficult or even impossible. An attempt at partial elimination of the problem of overlapping reflections using texture as an intensity‐separating `device' is described.