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The ( hkl ) Dependence of Diffraction‐Line Broadening Caused by Strain and Size for all Laue Groups in Rietveld Refinement
Author(s) -
Popa N. C.
Publication year - 1998
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889897009795
Subject(s) - crystallite , rietveld refinement , diffraction , anisotropy , crystallography , materials science , x ray crystallography , line (geometry) , crystal structure , chemistry , physics , optics , geometry , mathematics
Models are presented which are compatible with the Rietveld method for the anisotropic broadening of the diffracted peaks produced by crystallite size and microstrain. The models, derived from general crystallographic considerations, are different for different Laue groups.