Non‐Gaussian Roughness of Interfaces: Cumulant Expansion in X‐ray and Neutron Reflectivity | Zendy

Press W. | Zendy; Schlomka J.P. | Zendy; Tolan M. | Zendy; Asmussen B. | Zendy

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Non‐Gaussian Roughness of Interfaces: Cumulant Expansion in X‐ray and Neutron Reflectivity

Author(s) -

Press W.,

Schlomka J.P.,

Tolan M.,

Asmussen B.

Publication year - 1997

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s002188989700441x

Subject(s) - cumulant , x ray reflectivity , reflectivity , gaussian , surface finish , neutron , oscillation (cell signaling) , physics , edgeworth series , optics , computational physics , gaussian surface , condensed matter physics , materials science , mathematics , chemistry , quantum mechanics , biochemistry , statistics , composite material , electric field

Within the Born approximation, a cumulant expansion is used for the formulation of X‐ray or neutron reflectivity. Odd‐ (third‐) order cumulants indicate asymmetric profiles; they may only be detected in layer systems via a Q z dependence of the oscillation period of Kiessig fringes. Fourth‐order cumulants are also visible in the larger Q z regime for single interface systems. As an example of an asymmetric surface, a triangular height distribution function is discussed.

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