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Non‐Gaussian Roughness of Interfaces: Cumulant Expansion in X‐ray and Neutron Reflectivity
Author(s) -
Press W.,
Schlomka J.P.,
Tolan M.,
Asmussen B.
Publication year - 1997
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188989700441x
Subject(s) - cumulant , x ray reflectivity , reflectivity , gaussian , surface finish , neutron , oscillation (cell signaling) , physics , edgeworth series , optics , computational physics , gaussian surface , condensed matter physics , materials science , mathematics , chemistry , quantum mechanics , biochemistry , statistics , composite material , electric field
Within the Born approximation, a cumulant expansion is used for the formulation of X‐ray or neutron reflectivity. Odd‐ (third‐) order cumulants indicate asymmetric profiles; they may only be detected in layer systems via a Q z dependence of the oscillation period of Kiessig fringes. Fourth‐order cumulants are also visible in the larger Q z regime for single interface systems. As an example of an asymmetric surface, a triangular height distribution function is discussed.