A new single‐crystal mounting technique for low‐background high‐temperature X‐ray diffraction | Zendy

Schreuer J. | Zendy; Baumgarte A. | Zendy; Steurer W. | Zendy

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A new single‐crystal mounting technique for low‐background high‐temperature X‐ray diffraction

Author(s) -

Schreuer J.,

Baumgarte A.,

Steurer W.

Publication year - 1997

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889897003142

Subject(s) - diffraction , crystal (programming language) , materials science , single crystal , optics , scanner , x ray crystallography , crystallography , physics , computer science , chemistry , programming language

A new single‐crystal mounting technique for high‐temperature X‐ray diffraction up to 1700 K on an imaging plate scanner has been developed. The crystal is clamped mechanically by three to six very thin alumina fibres. Besides the cheap and easy manufacturing procedure, its major advantage is the resultant very low background; it consists mainly of weak, smooth Debye–Scherrer rings which can be easily removed by image‐processing methods.

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