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The Use of a Multi‐Double‐Crystal Diffractometer to Investigate Nickel Domains
Author(s) -
Treimer W.,
Höfer A.,
Strothmann H.
Publication year - 1997
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889897001052
Subject(s) - diffractometer , monochromator , crystal (programming language) , angular resolution (graph drawing) , resolution (logic) , optics , materials science , intensity (physics) , neutron , nickel , single crystal , crystallography , spectrum analyzer , crystal structure , physics , chemistry , nuclear physics , mathematics , wavelength , programming language , combinatorics , artificial intelligence , computer science , metallurgy
The investigations of the domain structure in Ni single crystals is best performed with a double‐crystal diffractometer. Conventional small‐angle instruments do not have the necessary angular resolution to distinguish satellites of a main peak due to spin‐dependent refraction of unpolarized neutrons by Bloch walls in Ni. With the help of a double‐crystal diffractometer operating with lamellae crystals as monochromator and analyzer, the angular resolution is maintained but the intensity enhanced by a factor of 5.4. Within a series of measurements, it was possible to investigate Ni domains due to the high angular resolution of the new multi‐double‐crystal instrument and this improved intensity. The first results of the domain structure in (110) Ni single crystals and a good estimation of the Bloch wall thickness are given.