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Smoothing of low‐intensity noisy X‐ray diffraction data by Fourier filtering: application to supported metal catalyst studies
Author(s) -
Mierzwa B.,
Pielaszek J.
Publication year - 1997
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889897000198
Subject(s) - smoothing , fourier transform , diffraction , intensity (physics) , catalysis , x ray , metal , fourier transform infrared spectroscopy , materials science , optics , analytical chemistry (journal) , computer science , physics , chemistry , mathematics , metallurgy , computer vision , mathematical analysis , organic chemistry
A Wiener filtering algorithm was used to smooth broad and noisy X‐ray diffraction (XRD) patterns from highly dispersed catalysts with low metal loading. It enabled extraction of XRD patterns from the active phases of the catalysts interpretable in terms of phase composition.