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X‐ray Diffraction‐Line Broadening Analysis: Paracrystalline Method
Author(s) -
Somashekar R.,
Somashekarappa H.
Publication year - 1997
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889896010023
Subject(s) - paracrystalline , diffraction , line (geometry) , basis (linear algebra) , materials science , optics , crystallography , computational physics , physics , chemistry , geometry , mathematics
Line‐profile simulation and matching on the basis of a paracrystalline one‐dimensional Hosemann model provides a promising approach to the analysis of line broadening. Results of analysis using X‐ray wide‐angle data of polymers and metallic samples are compared with Warren–Averbach multiple‐order and single‐order methods. Various column‐length‐distribution functions are also used for better agreement with the experimental profiles.