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Rietveld Refinement using Synchrotron X‐ray Powder Diffraction Data Collected in Transmission Geometry using an Imaging‐Plate Detector: Application to Standard m ‐ZrO 2
Author(s) -
Gualtieri A.,
Norby P.,
Hanson J.,
Hriljac J.
Publication year - 1996
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889896008199
Subject(s) - synchrotron , powder diffraction , rietveld refinement , detector , diffraction , materials science , optics , physics , crystallography , chemistry , nuclear magnetic resonance
The results of Rietveld refinements using synchrotron X‐ray powder diffraction data collected in transmission mode with a new flat imaging‐plate (IP) technique agree with those obtained from other techniques, m ‐ZrO 2 was chosen as test compound because it was the standard selected by the Commission on Powder Diffraction of the International Union of Crystallography for a round robin of Rietveld refinement using data obtained by different techniques and from different laboratories [Hill & Cranswick (1994). J. Appl. Cryst. 27 , 802–844]. For comparison, new data were also collected using a gas‐filled position‐sensitive detector. Powder diffraction using a flat IP detector requires a modification to the geometric term of the Lorentz factor and the zero‐shift correction. Other factors that were accurately taken into account are the polarization of the synchrotron beam, the angle‐dependent variations induced by the use of a flat detector and the absorption.