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X‐ray Moiré Topography on SIMOX Structures
Author(s) -
Ohler M.,
Prieur E.,
Härtwig J.
Publication year - 1996
Publication title -
journal of applied crystallography
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889896006401
Subject(s) - moiré pattern , perpendicular , materials science , triclinic crystal system , diffraction , optics , curvature , deformation (meteorology) , x ray , geometry , crystallography , physics , composite material , chemistry , crystal structure , mathematics