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Construction of a double‐radius Guinier diffractometer using Mo K α 1 radiation and a one‐ or two‐dimensional detection system
Author(s) -
Otto H. H.,
Hofmann W.
Publication year - 1996
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889896005377
Subject(s) - diffractometer , monochromator , bent molecular geometry , radius , optics , diffraction , radiation , materials science , scintillation , radius of curvature , physics , computer science , geometry , mathematics , curvature , scanning electron microscope , wavelength , mean curvature , computer security , mean curvature flow , detector , composite material
This paper presents the design for a computer‐assisted double‐radius Guinier system for Mo Kα 1 radiation with a cylindrically bent imaging plate and an integrated readout scanner for the recorded diffraction patterns. This quick X‐ray detection technique makes new applications for the Guinier method possible. The addition of suitable components such as an optimized monochromator, a set‐up for changing, moving and heating the samples and sophisticated adjustment equipment improves the diffractometer, making it a competitive in‐house system for powder characterization and crystal structure determination of high standard. The commonly used scintillation tube arrangement should also be adapted to receive a multifunctional system.