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Quantitative Phase Analysis by X‐ray Diffraction of Multiphased Binary Alloy Coatings: Application to Brass Coating
Author(s) -
Bolle B.,
Tidu A.,
Heizmann J. J.,
Pelletier B.
Publication year - 1996
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889896003615
Subject(s) - brass , diffraction , phase (matter) , diffusion , coating , materials science , alloy , binary number , x ray crystallography , analytical chemistry (journal) , optics , chemistry , metallurgy , physics , composite material , thermodynamics , mathematics , copper , arithmetic , organic chemistry , chromatography
A quantitative phase‐analysis method is proposed to analyse by X‐ray diffraction multiphased thin films obtained by diffusion. Intensity corrections taking into account the spatial distribution of the different phases, and computing of phase concentrations without standards are presented. It is shown that important errors can be made if one does not take the nonhomogeneity of phase distributions into account. As an example, the quantitative phase analysis of a brass layer obtained by a diffusion process is given.