Premium
High‐Temperature Furnace for an Imaging‐Plate Data‐Acquisition System
Author(s) -
Schreuer J.,
Baumgarte A.,
Estermann M. A.,
Steurer W.,
Reifler H.
Publication year - 1996
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889896000660
Subject(s) - crystallite , diffraction , inert gas , atmospheric temperature range , thermal , scanner , atmosphere (unit) , optics , materials science , pyrometer , scattering , reproducibility , data acquisition , temperature measurement , radiation , chemistry , physics , computer science , composite material , meteorology , metallurgy , thermodynamics , chromatography , operating system
A compact furnace has been developed, for low‐background high‐temperature X‐ray studies, that can be used routinely with an on‐line imaging‐plate scanner (MAR Research). The furnace operates under an inert‐gas atmosphere between ambient temperature and 1500 K with a relative thermal stability of ±0.5 K in long‐time experiments, and an absolute thermal reproducibility of 1% of the setting temperature in successive runs. Computer‐controlled temperature regulation permits the automatic collection of in situ diffraction data on single crystals as well as on polycrystalline samples. Further characteristics are a large opening angle (2 θ = 37°) window for diffracted beams allowing the collection of extensive data sets with Mo Kα radiation, low construction costs and easy handling. The practicability of the furnace is demonstrated on the example of decagonal Al 72.7 Co 11.6 Ni 15.7 , which undergoes in the range between ambient temperature and 1200 K several phase transitions connected with complex scattering phenomena.