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A method of complete generation of back‐reflection Laue patterns of any single crystal
Author(s) -
Marín C.,
Diéguez E.
Publication year - 1995
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889895010971
Subject(s) - reflection (computer programming) , optics , detector , crystal (programming language) , radiation , physics , materials science , computer science , programming language
Complete numerical simulations of X‐ray back‐reflection Laue‐grams have been carded out. The main factors that affect the intensities of Laue‐gram spots have been evaluated. The proposed procedure is general and can be applied to any crystalline material and for any kind of detector and radiation source. The computational requirements are minimal and inexpensive. Excellent agreement between the experimental and the simulated Laue‐grams are observed. To demonstrate the potential of these procedures, the case of LiNbO 3 is presented here. Exact replication of the Laue‐gram for LiNbO 3 has been obtained.