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Two‐Dimensional Desmearing of Centrosymmetric Small‐Angle X‐ray Scattering Diffraction Patterns
Author(s) -
Le Flanchec V.,
Gazeau D.,
Taboury J.,
Zemb Th.
Publication year - 1996
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889895008144
Subject(s) - optics , scattering , diffraction , small angle scattering , range (aeronautics) , physics , resolution (logic) , computational physics , geometry , materials science , mathematics , computer science , artificial intelligence , composite material
Owing to the high dynamic range and resolution of image plates, digitization of the direct‐beam profile as well as of two‐dimensional small‐angle X‐ray scattering patterns gives data with enough accuracy to allow desmearing of two‐dimensional patterns after corrections of geometrical distortions. A radial conversion of the images is used to compress the images and to isolate a small area of interest. The results obtained by the Wiener filtering method and the iterative method of Van Cittert on simulated patterns are compared.