Premium
Development of a New Imaging‐Plate Diffractometer (IPD‐WAS) for Time‐Resolved Crystallography with a Laboratory X‐ray Source
Author(s) -
Kamiya N.,
Iwasaki H.
Publication year - 1995
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889895005905
Subject(s) - diffractometer , optics , crystal (programming language) , x ray , sample (material) , materials science , rotation (mathematics) , line (geometry) , physics , computer science , artificial intelligence , geometry , scanning electron microscope , mathematics , thermodynamics , programming language
A new imaging‐plate diffractometer of the Weissenberg‐camera type with an adjustable multilayer‐line screen system (IPD‐WAS) has been developed. Prior to data collection, the IPD‐WAS automatically aligns the axis of a sample crystal and sets the multilayer‐line (MLL) screens. The MLL‐screen system is adaptable to a wide range of cell parameters of the sample crystals, and is advantageous for taking photographs in a wide rotation angle with a low background level. For Weissenberg photography, the IPD‐WAS system uses two cylindrical imaging plates (IPs). The IPs are read two‐dimensionally by rotary and transverse mechanisms. The rotary readout system has nonuniformity of response less than 1.4%, efficiency near 100% for Cu Kα radiation, a dynamic range of 1:10 6 and spatial resolutions of 220 and 200 μm in the two directions. Owing to the good performance of the adjustable MLL screen system and the rotary readout system, the IPD‐WAS achieves a data acquisition time of about l h with reflection data of sufficient quality ( R merge = 2.3% for a standard sample crystal), which is suitable for time‐resolved X‐ray crystallography. The IPD‐WAS also enables faster crystal structure determinations of small molecules, including unstable crystals.